PERS has the latest 

Scanning Electron Microscope (SEM)

 that is attached to an Energy Dispersive Spectrometer (EDS) system. SEM is a great diagnostic tool for:


  • Failure Investigation
  • Fractography
  • Quality Control
  • Morphology and Identification of Localized Defects
  • Identifying Corrosion products at Microscopic levels
  • Identifying Surface Coating or Plating
  • Particle Size & Shape Analysis
  • Characterizing Creep in Microstructure
  • Identifying Submicron Features in Microstructure
  • Identification of Inclusions in metals

PERS has the SEMART SS-100 that offers a simple and extremely user-friendly operating console equipped with a turbo-molecular pumping system to achieve a high vacuum that requires absolutely no time to start-up. The 

EDS Analyzer

 X-Max 20 is a versatile X-Ray spectrometer system, which does not require liquid nitrogen for its operation. This reduces the start time for EDS-accelerating voltages and lower spot sizes resulting in improved accuracy and quantification of elements that sometimes, can be a limitation for the conventional EDS detectors with 10-mm² areas.


Scanning Electron Microscope


Metallurgical Evaluation


The metallurgists at PERS have deep expertise in Metallographic preparation and examination to evaluate the characteristics of metals. They are highly skilled to assess a particular material’s heat treatment condition, microstructure, and forming process. The team undertakes macro and micro examination including Weld Examination, Case Depth and Decarburization Measurement, Micro Hardness Testing and Coating/Plating evaluation.

The Metallography department employs the Inverted Metallurgical microscope, Olympus GX51 and the Leco 500 microscope with an Image Analysis System. The technical team has indigenously developed a microstructure characterizer software that assists with the analysis of images to determine microstructural degradation due to creep. The software can also calculate the graphitization, depth or width of decarburization, phase/volume percentage, grain growth, inclusion rating, particle size, volume percentage, particle count, porosity and coating thickness.